Vol. 6 (2019)

Articles

• Defect Removal Efficiency Across Software Development Phases

  Sofia Alvarez

  1-5

  • PDF

• Software Configuration Auditing in Multi-Version Systems

  Benjamin Clark

  6-10

  • PDF

• Software Inspection Techniques for Early Defect Detection

  Luca Conti

  11-15

  • PDF

• Software Quality Measurement Using ISO 9126 Quality Model

  Pablo Herrera

  16-20

  • PDF

• Software Reuse Practices in Object-Oriented Development

  Elena Popescu

  21-25

  • PDF

• Migrating Sensitive Government Databases to AWS RDS: Security, Compliance, and Risk Mitigation

  Harsha Vardhan Reddy Kavuluri, Srikanth Reddy Keshireddy

  26-32

  • PDF

• Predictive Modeling of Wafer Acceptance Test Parameters for Semiconductor Yield Enhancement

  Srinivasa rao Gondi

  33-38

  • PDF